In scan chains if some flip flops are +ve edge triggered and remaining flip flops are -ve edge triggered how it behaves?


Answer:


For designs with both positive and negative clocked flops, the scan insertion tool will always route the scan chain so that the negative clocked flops come before the positive edge flops in the chain. This avoids the need of lockup latch.


For the same clock domain the negedge flops will always capture the data just captured into the posedge flops on the posedge of the clock.


For the multiple clock domains, it all depends upon how the clock trees are balanced. If the clock domains are completely asynchronous, ATPG has to mask the receiving flops.

2 comments:

  1. Replies
    1. Automated Test Pattern Generation. A tool that generates patterns that will detect specific faults.

      Delete

Your Comments... (comments are moderated)